Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves - Wolf Kleinert - Books - Springer International Publishing AG - 9783319813790 - May 27, 2018
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Defect Sizing Using Non-destructive Ultrasonic Testing: Applying Bandwidth-Dependent DAC and DGS Curves Softcover reprint of the original 1st ed. 2016 edition


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This book presents a precise approach for defect sizing using ultrasonics. The approach presented here is not only valid for conventional angle beam probes, but also for phased array angle beam probes. Its content is of interest to all those working with distance gain size (DGS) methods or are using distance amplitude correction (DAC) curves.


118 pages, 83 Illustrations, color; 7 Illustrations, black and white; XVIII, 118 p. 90 illus., 83 il

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 27, 2018
ISBN13 9783319813790
Publishers Springer International Publishing AG
Pages 118
Dimensions 150 × 220 × 10 mm   ·   204 g

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