Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation - Fangzhou Xia - Books - Springer International Publishing AG - 9783031442353 - February 7, 2025
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Fangzhou Xia
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation

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From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).

Media Books     Paperback Book   (Book with soft cover and glued back)
Released February 7, 2025
ISBN13 9783031442353
Publishers Springer International Publishing AG
Pages 366
Dimensions 150 × 220 × 10 mm   ·   664 g
Language German  

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