Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation - Fangzhou Xia - Books - Springer International Publishing AG - 9783031442322 - February 7, 2024
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Fangzhou Xia
Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation 2024 edition

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From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM).

370 pages, 200 Tables, color; 125 Illustrations, color; 13 Illustrations, black and white; XXIV, 370

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 7, 2024
ISBN13 9783031442322
Publishers Springer International Publishing AG
Pages 366
Dimensions 150 × 220 × 20 mm   ·   823 g
Language German  

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