Edmund G. Seebauer
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes Edmund G. Seebauer Softcover reprint of hardcover 1st ed. 2009 edition

Name: Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes
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Author: Edmund G. Seebauer

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Hardcover Book

2009 edition

(2008) HK$ 1,242

Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes

Edmund G. Seebauer

Softcover reprint of hardcover 1st ed. 2009 edition

"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.

298 pages, 30 black & white tables, biography

Media	Books Paperback Book (Book with soft cover and glued back)
Released	October 22, 2010
ISBN13	9781849968201
Publishers	Springer London Ltd
Pages	298
Dimensions	155 × 235 × 16 mm · 435 g
Language	English