Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes - Edmund G. Seebauer - Books - Springer London Ltd - 9781848820586 - December 1, 2008
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Edmund G. Seebauer
Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion - Engineering Materials and Processes 2009 edition

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"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.

298 pages, 30 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released December 1, 2008
ISBN13 9781848820586
Publishers Springer London Ltd
Pages 298
Dimensions 155 × 235 × 25 mm   ·   635 g
Language English  

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