Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing - Manoj Sachdev - Books - Springer-Verlag New York Inc. - 9781441942852 - November 10, 2010
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Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing Softcover reprint of hardcover 2nd ed. 2007 edition

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 10, 2010
ISBN13 9781441942852
Publishers Springer-Verlag New York Inc.
Pages 328
Dimensions 155 × 235 × 18 mm   ·   494 g
Language English  

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