Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing - Manoj Sachdev - Books - Springer-Verlag New York Inc. - 9780387465463 - June 21, 2007
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Manoj Sachdev
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits - Frontiers in Electronic Testing 2nd ed. 2007 edition

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The 2nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield.

328 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released June 21, 2007
ISBN13 9780387465463
Publishers Springer-Verlag New York Inc.
Pages 328
Dimensions 155 × 235 × 20 mm   ·   721 g
Language English  

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