Thermal-Aware Testing of Digital VLSI Circuits and Systems - Santanu Chattopadhyay - Books - Taylor & Francis Inc - 9780815378822 - April 25, 2018
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Santanu Chattopadhyay
Thermal-Aware Testing of Digital VLSI Circuits and Systems 1st edition

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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

118 pages, 10 Illustrations, black and white

Media Books     Hardcover Book   (Book with hard spine and cover)
Released April 25, 2018
ISBN13 9780815378822
Publishers Taylor & Francis Inc
Pages 118
Dimensions 225 × 145 × 14 mm   ·   296 g
Language English  

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