Thermal-Aware Testing of Digital VLSI Circuits and Systems - Santanu Chattopadhyay - Books - Taylor & Francis Ltd - 9780367607098 - June 30, 2020
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Santanu Chattopadhyay
Thermal-Aware Testing of Digital VLSI Circuits and Systems 1st edition

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This book aims to highlight the research activities in the domain of thermal-aware testing. Thermal-aware testing can be employed both at circuit level and at system level. This book will be suitable for researchers working on power- and thermal-aware design and the testing of digital VLSI chips.

118 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 30, 2020
ISBN13 9780367607098
Publishers Taylor & Francis Ltd
Pages 118
Dimensions 150 × 220 × 10 mm   ·   172 g
Language English  

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