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X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
X-Ray Scattering Techniques for Epitaxial Oxide Thin Films
The first chapter considers laboratory-based X-ray diffraction (XRD) methods: the indispensable X-ray characterization methods used for phase analysis, epitaxial relationship determination, advanced analytical and data fitting techniques, and grazing incidence diffraction.
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | August 12, 2025 |
| ISBN13 | 9789819659449 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 186 |
| Dimensions | 150 × 220 × 20 mm · 453 g |
| Editor | Evans, Paul G. |
| Editor | Sando, Daniel |
| Editor | Valanoor, Nagarajan |