VLSI Design and Test - - Books - Springer Verlag, Singapore - 9789811074691 - December 22, 2017
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VLSI Design and Test 1st ed. 2017 edition

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This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.

815 pages, 486 Illustrations, black and white; XXI, 815 p. 486 illus.

Media Books     Book
Released December 22, 2017
ISBN13 9789811074691
Publishers Springer Verlag, Singapore
Pages 815
Dimensions 150 × 220 × 20 mm   ·   1.25 kg
Editor Dasgupta, Sudeb
Editor Kaushik, Brajesh Kumar
Editor Singh, Virendra