Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering - Smita Krishnaswamy - Books - Springer - 9789400797987 - October 15, 2014
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Smita Krishnaswamy
Design, Analysis and Test of Logic Circuits Under Uncertainty - Lecture Notes in Electrical Engineering 2013 edition

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Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques.

124 pages, 24 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 15, 2014
ISBN13 9789400797987
Publishers Springer
Pages 124
Dimensions 155 × 235 × 7 mm   ·   199 g
Language English  

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