Development of a reference database for ion beam analysis - IAEA-TECDOC Series - International Atomic Energy Agency - Books - IAEA - 9789201105158 - December 14, 2015
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International Atomic Energy Agency
Development of a reference database for ion beam analysis - IAEA-TECDOC Series

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Ion beam analysis techniques are non-destructive analytical techniques used to identify the composition and provide elemental depth profiles in surface layers of materials. Their reliability and accuracy depends on our knowledge of the nuclear reaction cross sections. This publication describes the coordinated effort to measure, compile and evaluate cross section data relevant to these techniques.

226 pages, col. ill. figs, tables

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 14, 2015
ISBN13 9789201105158
Publishers IAEA
Pages 226
Dimensions 150 × 220 × 10 mm   ·   502 g   (Weight (estimated))

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