Metody Povysheniya Nadyezhnosti Mikroskhem Na Osnove Testovykh Struktur: Osnovy Upravleniya Kachestvom Integral'nykh Mikroskhem - Arkadiy Turtsevich - Books - LAP LAMBERT Academic Publishing - 9783848431076 - April 6, 2012
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Arkadiy Turtsevich
Metody Povysheniya Nadyezhnosti Mikroskhem Na Osnove Testovykh Struktur: Osnovy Upravleniya Kachestvom Integral'nykh Mikroskhem Russian edition

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V monografii detal'no rassmotrena sistema testovogo kontrolya kachestva tekhnologicheskogo protsessa izgotovleniya mikroskhem, protsedura obrabotki dannykh i modelirovaniya vykhoda godnykh kristallov IMS. Osoboe znachenie udeleno metodam otsenki nadezhnosti kristallov mikroskhem v sostave plastin na etape tekhnologicheskogo protsessa izgotovleniya IMS, pozvolyayushchikh optimizirovat' protsessy i obespechit' vysokiy uroven' nadezhnosti korpusirovannykh mikroskhem. Privedeny rezul'taty issledovaniy nadyezhnosti mnogosloynykh tonkoplyenochnykh sistem metallizatsii, konkretnye rezul'taty prakticheskogo primeneniya ryada metodov vyyavleniya i otbrakovki korpusirovannykh mikroskhem so skrytymi defektami: analiz dinamicheskogo toka potrebleniya, vozdeystviya impul'sov staticheskogo elektrichestva, termotsiklirovaniya, povyshennogo napryazheniya pitaniya. Kniga prednaznachena dlya spetsialistov elektronnoy i radioelektronnoy promyshlennosti, a takzhe studentov i aspirantov vuzov sootvetstvuyushchey spetsial'nosti.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 6, 2012
ISBN13 9783848431076
Publishers LAP LAMBERT Academic Publishing
Pages 248
Dimensions 150 × 14 × 226 mm   ·   387 g
Language German  

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