High Performance Gan Light-emitting Diode: a Reliability Study - Zonglin Li - Books - LAP LAMBERT Academic Publishing - 9783844395297 - May 17, 2011
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Zonglin Li
High Performance Gan Light-emitting Diode: a Reliability Study

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The reliability of InGaN/GaN light emitting diodes (LEDs) with different emission wavelengths and different geometries was studied. Device performances, like current-voltage characteristics, 1/f noise spectrum, leakage, static resistance, were measured. The devices underwent a 1000-hr constant-current stress test and their optical output degradation rate was examined. The results were explained by cross-related data.

Media Books     Paperback Book   (Book with soft cover and glued back)
Released May 17, 2011
ISBN13 9783844395297
Publishers LAP LAMBERT Academic Publishing
Pages 80
Dimensions 150 × 5 × 226 mm   ·   137 g
Language German  

See all of Zonglin Li ( e.g. Paperback Book )