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Built-in Self-test of Global Routing Resources in Fpgas: Bist for Xilinx Virtex-4 Fpgas Jia Yao
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Built-in Self-test of Global Routing Resources in Fpgas: Bist for Xilinx Virtex-4 Fpgas
Jia Yao
It is important to test programmable routing resources in Field Programmable Gate Arrays (FPGAs) because they take up the largest portion of configuration memory bits. In Virtex-4 FPGAs, routing resources account for over 80% of the configuration memory. Built-In Self-Test (BIST) is adopted to test the routing resources in FPGAs and overcomes issues residing in previously developed test approaches. Analysis and evaluations of developed BIST algorithm and configurations are provided.
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | January 18, 2011 |
| ISBN13 | 9783843374958 |
| Publishers | LAP LAMBERT Academic Publishing |
| Pages | 88 |
| Dimensions | 225 × 5 × 150 mm · 149 g |
| Language | German |
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