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Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics Softcover reprint of the original 1st ed. 2017 edition
Resonant X-Ray Scattering in Correlated Systems - Springer Tracts in Modern Physics
The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.
241 pages, 25 Illustrations, color; 126 Illustrations, black and white; VII, 241 p. 151 illus., 25 i
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | July 7, 2018 |
| ISBN13 | 9783662571224 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 241 |
| Dimensions | 150 × 220 × 10 mm · 388 g |
| Language | German |
| Editor | Ishihara, Sumio |
| Editor | Murakami, Youichi |