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Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State - Springer Tracts in Modern Physics Andreas Rosenauer Softcover reprint of the original 1st ed. 2003 edition
Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State - Springer Tracts in Modern Physics
Andreas Rosenauer
This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.
253 pages, 186 black & white illustrations, 47 colour illustrations, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | November 20, 2013 |
| ISBN13 | 9783662146187 |
| Publishers | Springer-Verlag Berlin and Heidelberg Gm |
| Pages | 241 |
| Dimensions | 155 × 235 × 14 mm · 362 g |
| Language | German |