Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State - Springer Tracts in Modern Physics - Andreas Rosenauer - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783662146187 - November 20, 2013
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Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State - Springer Tracts in Modern Physics Softcover reprint of the original 1st ed. 2003 edition

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This book provides tools well suited for thequantitative investigation of semiconductor electron microscopy. The bookfocuses on new methods including strain stateanalysis as well as evaluation of the compositionvia the lattice fringe analysis (CELFA) technique.


253 pages, 186 black & white illustrations, 47 colour illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 20, 2013
ISBN13 9783662146187
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 241
Dimensions 155 × 235 × 14 mm   ·   362 g
Language German  

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