Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics - Otwin Breitenstein - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642264788 - November 6, 2012
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Otwin Breitenstein
Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials - Springer Series in Advanced Microelectronics Softcover reprint of hardcover 2nd ed. 2010 edition

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Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.

258 pages, 56 black & white illustrations, 33 colour illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 6, 2012
ISBN13 9783642264788
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 258
Dimensions 155 × 235 × 18 mm   ·   385 g
Language English  

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