Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces - Springer Series in Surface Sciences - Sascha Sadewasser - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783642225659 - October 22, 2011
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Sascha Sadewasser
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces - Springer Series in Surface Sciences 2012 edition

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Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials.

290 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 22, 2011
ISBN13 9783642225659
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 334
Dimensions 162 × 242 × 25 mm   ·   612 g
Language German  
Editor Glatzel, Thilo
Editor Sadewasser, Sascha

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