Tell your friends about this item:
Untersuchung und Reduzierung des Leckstroms integrierter Schaltungen in Nanometer-Technologien bei konstanten Performanceanforderungen Frank Sill German edition
Do you have a profile? Log in
Get notified about new Frank Sill releases
Add to your iMusic wish list
Untersuchung und Reduzierung des Leckstroms integrierter Schaltungen in Nanometer-Technologien bei konstanten Performanceanforderungen
Frank Sill
232 pages
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | January 12, 2009 |
| ISBN13 | 9783640227419 |
| Publishers | Grin Verlag |
| Pages | 232 |
| Dimensions | 148 × 210 × 13 mm · 337 g |
| Language | German |
See all of Frank Sill ( e.g. Paperback Book )