Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology - - Books - Springer-Verlag Berlin and Heidelberg Gm - 9783540850380 - November 4, 2008
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Applied Scanning Probe Methods XII: Characterization - NanoScience and Technology 2009 edition

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Additi- ally they might be damaged by the electron beam of the microscope or the vacuum might cause outgasing of solvents or evaporation of water and thus change material properties.

279 pages, 14 black & white tables, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released November 4, 2008
ISBN13 9783540850380
Publishers Springer-Verlag Berlin and Heidelberg Gm
Pages 224
Dimensions 162 × 244 × 16 mm   ·   498 g
Language French  
Editor Bhushan, Bharat
Editor Fuchs, Harald

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