Helium Ion Microscopy - NanoScience and Technology - - Books - Springer International Publishing AG - 9783319824734 - June 16, 2018
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Helium Ion Microscopy - NanoScience and Technology Softcover reprint of the original 1st ed. 2016 edition

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This book covers the fundamentals of Helium Ion Microscopy (HIM) including the Gas Field Ion Source (GFIS), column and contrast formation. The expert reader will find a complete reference of the technique covering all important applications in several chapters written by the leading experts in the field.

526 pages, 100 Tables, color; 204 Illustrations, color; 116 Illustrations, black and white; XXIII, 5

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 16, 2018
ISBN13 9783319824734
Publishers Springer International Publishing AG
Pages 526
Dimensions 156 × 234 × 32 mm   ·   814 g
Language German  
Editor Golzhauser, Armin
Editor Hlawacek, Gregor

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