Debug Automation from Pre-silicon to Post-silicon - Mehdi Dehbashi - Books - Springer International Publishing AG - 9783319093086 - October 9, 2014
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Mehdi Dehbashi
Debug Automation from Pre-silicon to Post-silicon 2015 edition

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This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.

  • Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;
  • Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;
  • Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.

171 pages, 38 black & white illustrations, 55 colour illustrations, 12 black & white tables, biograp

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 9, 2014
ISBN13 9783319093086
Publishers Springer International Publishing AG
Pages 171
Dimensions 155 × 235 × 13 mm   ·   439 g
Language English  

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