CMOS Plasma and Process Damage - Kirk Prall - Books - Springer International Publishing AG - 9783031890284 - May 17, 2025
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Kirk Prall
CMOS Plasma and Process Damage

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Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.

Media Books     Hardcover Book   (Book with hard spine and cover)
Released May 17, 2025
ISBN13 9783031890284
Publishers Springer International Publishing AG
Pages 466
Dimensions 150 × 220 × 20 mm   ·   891 g
Language German  

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