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Noise in Nanoscale Semiconductor Devices 2020 edition
Noise in Nanoscale Semiconductor Devices
III-V materials, 2D materials, and multi-state defects. Describes the state-of-the-art, regarding noise in nanometer semiconductor devices; Enables readers to design more reliable semiconductor devices; Offers the most up-to-date information on point defects, based on physical microscopic models.
729 pages, 443 Illustrations, color; 107 Illustrations, black and white; VI, 729 p. 550 illus., 443
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | April 27, 2021 |
| ISBN13 | 9783030375027 |
| Publishers | Springer Nature Switzerland AG |
| Pages | 729 |
| Dimensions | 150 × 220 × 10 mm · 1.11 kg |
| Language | German |
| Editor | Grasser, Tibor |