ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis - ASM International - Books - A S M International - 9781627081504 - January 30, 2018
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ASM International
ISTFA 2017 Proceedings from the 43rd International Symposium for Testing and Failure Analysis

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The theme for the November 2017 conference is Striving for 100% Success Rate. Papers focus on the tools and techniques needed for maximizing the success rate in every aspect of the electronic device failure analysis process.

660 pages

Media Books     Paperback Book   (Book with soft cover and glued back)
Released January 30, 2018
ISBN13 9781627081504
Publishers A S M International
Pages 660
Dimensions 150 × 220 × 10 mm   ·   987 g   (Weight (estimated))

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