Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience - Jian Min Zuo - Books - Springer-Verlag New York Inc. - 9781493966059 - October 26, 2016
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Jian Min Zuo
Advanced Transmission Electron Microscopy: Imaging and Diffraction in Nanoscience 1st ed. 2017 edition

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As the title implies, the focus of the book has changed from electron microdiffraction and convergent beam electron diffraction to all forms of advanced transmission electron microscopy.

755 pages, 92 black & white illustrations, 218 colour illustrations, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released October 26, 2016
ISBN13 9781493966059
Publishers Springer-Verlag New York Inc.
Pages 729
Dimensions 155 × 235 × 44 mm   ·   1.42 kg
Language English  

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