Bias Temperature Instability for Devices and Circuits - - Books - Springer-Verlag New York Inc. - 9781493955299 - October 1, 2016
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Bias Temperature Instability for Devices and Circuits Softcover reprint of the original 1st ed. 2014 edition

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Readers will benefit from state-of-the art coverage of research in topics such as time dependent defect spectroscopy, anomalous defect behavior, stochastic modeling with additional metastable states, multiphonon theory, compact modeling with RC ladders and implications on device reliability and lifetime.

821 pages, 283 black & white illustrations, 318 colour illustrations, 22 black & white tables, biogr

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 1, 2016
ISBN13 9781493955299
Publishers Springer-Verlag New York Inc.
Pages 810
Dimensions 150 × 220 × 10 mm   ·   1.37 kg
Language English  
Editor Grasser, Tibor

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