Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs - Ruijing Shen - Books - Springer-Verlag New York Inc. - 9781489987877 - April 13, 2014
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Ruijing Shen
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs 2012 edition

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This book covers statistical modeling and analysis of VLSI systems with a focus on interconnects, on-chip power grids and clock networks and analog/mixed-signal circuits. It offers an analysis of each algorithm with applications in real circuit design.

306 pages, 61 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released April 13, 2014
ISBN13 9781489987877
Publishers Springer-Verlag New York Inc.
Pages 306
Dimensions 155 × 235 × 18 mm   ·   511 g
Language English  

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