Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing - Elie Maricau - Books - Springer-Verlag New York Inc. - 9781489986306 - June 19, 2015
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Elie Maricau
Analog IC Reliability in Nanometer CMOS - Analog Circuits and Signal Processing 2013 edition

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This book focuses on modeling, simulation and analysis of analog circuit aging. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared.

198 pages, 16 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 19, 2015
ISBN13 9781489986306
Publishers Springer-Verlag New York Inc.
Pages 198
Dimensions 155 × 235 × 12 mm   ·   308 g
Language English  

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