Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations - Rajesh Garg - Books - Springer-Verlag New York Inc. - 9781489985101 - November 28, 2014
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Rajesh Garg
Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations 2010 edition

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This monograph is motivated by the challenges faced in designing reliable VLSI systems in modern VLSI processes. The work presented in this research mo- graph presents several analysis and design techniques with the goal of realizing VLSI circuits, which are radiation and process variation tolerant.

212 pages, 28 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 28, 2014
ISBN13 9781489985101
Publishers Springer-Verlag New York Inc.
Pages 212
Dimensions 155 × 235 × 13 mm   ·   335 g
Language English  

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