Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio - Books - Springer-Verlag New York Inc. - 9781489983145 - September 3, 2014
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Alberto Bosio
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies 2010 edition

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies.

171 pages, 22 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 3, 2014
ISBN13 9781489983145
Publishers Springer-Verlag New York Inc.
Pages 171
Dimensions 155 × 235 × 10 mm   ·   272 g
Language English  

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