Electron Beam Testing Technology - Microdevices - John T L Thong - Books - Springer-Verlag New York Inc. - 9781489915245 - June 4, 2013
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John T L Thong
Electron Beam Testing Technology - Microdevices Softcover reprint of the original 1st ed. 1993 edition

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Although exploratory and developmental activity in electron beam testing (EBT) 25 years, it was not had already been in existence in research laboratories for over until the beginning of the 1980s that it was taken up seriously as a technique for integrated circuit (IC) testing.

480 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 4, 2013
ISBN13 9781489915245
Publishers Springer-Verlag New York Inc.
Pages 462
Dimensions 178 × 254 × 24 mm   ·   825 g
Language English  
Editor Thong, John T.L.

See all of John T L Thong ( e.g. Hardcover Book and Paperback Book )