Atomic Force Microscopy / Scanning Tunneling Microscopy 2 - Samuel H Cohen - Books - Springer-Verlag New York Inc. - 9781475793277 - June 4, 2013
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Samuel H Cohen
Atomic Force Microscopy / Scanning Tunneling Microscopy 2 Softcover reprint of the original 1st ed. 1997 edition

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Proceedings of the Second Symposium held in Natick, Massachusetts, June7-9, 1994

259 pages, 250 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 4, 2013
ISBN13 9781475793277
Publishers Springer-Verlag New York Inc.
Pages 250
Dimensions 178 × 254 × 14 mm   ·   462 g
Language English  
Editor Cohen, Samuel H.
Editor Lightbody, Marcia L.

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