Characterization of Crystal Growth Defects by X-Ray Methods - NATO Science Series B - B.K. Tanner - Books - Springer-Verlag New York Inc. - 9781475711288 - December 16, 2012
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B.K. Tanner
Characterization of Crystal Growth Defects by X-Ray Methods - NATO Science Series B Softcover reprint of the original 1st ed. 1980 edition

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This book contains the proceedings of a NATO Advanced Study Institute entitled "Characterization of Crystal Growth Defects by X-ray Methods' held in the University of Durham, England from 29th August to 10th September 1979.

589 pages, 556 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 16, 2012
ISBN13 9781475711288
Publishers Springer-Verlag New York Inc.
Pages 589
Dimensions 178 × 254 × 31 mm   ·   1.05 kg
Language English  

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