Helium Ion Microscopy: Principles and Applications - SpringerBriefs in Materials - David C. Joy - Books - Springer-Verlag New York Inc. - 9781461486596 - September 14, 2013
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David C. Joy
Helium Ion Microscopy: Principles and Applications - SpringerBriefs in Materials 2013 edition

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Helium Ion Microscopy: Principles and Applications describes the theory and discusses the practical details of why scanning microscopes using beams of light ions - such as the Helium Ion Microscope (HIM) - are destined to become the imaging tools of choice for the 21st century.

72 pages, 13 black & white illustrations, 16 colour illustrations, 2 black & white tables, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 14, 2013
ISBN13 9781461486596
Publishers Springer-Verlag New York Inc.
Pages 64
Dimensions 155 × 235 × 8 mm   ·   158 g
Language English  

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