Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems - Amith Singhee - Books - Springer-Verlag New York Inc. - 9781461426721 - November 5, 2012
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Amith Singhee
Extreme Statistics in Nanoscale Memory Design - Integrated Circuits and Systems

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This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community.

246 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 5, 2012
ISBN13 9781461426721
Publishers Springer-Verlag New York Inc.
Pages 246
Dimensions 155 × 235 × 13 mm   ·   367 g
Language English  
Editor Rutenbar, Rob A.
Editor Singhee, Amith

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