Advances in X-Ray Analysis: Volume 33 - - Books - Springer-Verlag New York Inc. - 9781461399988 - June 2, 2012
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Advances in X-Ray Analysis: Volume 33 Softcover reprint of the original 1st ed. 1990 edition

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The Plenary Session on x-ray analysis of thin films did not just happen this year but really began four years ago with Paul Predecki suggesting a special session devoted to thin film techniques. They were invited speakers for the 1985 special session on thin films and instructors for the 1987 workshop on epitaxial thin films.

724 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 2, 2012
ISBN13 9781461399988
Publishers Springer-Verlag New York Inc.
Pages 704
Dimensions 150 × 220 × 10 mm   ·   1.14 kg
Language English  
Editor Barrett, Charles S.
Editor Gilfrich, John V.
Editor Huang, Ting C.
Editor Jenkins, Ron

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