Advances in X-Ray Analysis: Volume 25 - John C Russ - Books - Springer-Verlag New York Inc. - 9781461399957 - July 24, 2012
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John C Russ
Advances in X-Ray Analysis: Volume 25 Softcover reprint of the original 1st ed. 1982 edition

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In alternating years, the Denver X-ray Conference turns its principal attention, through the choice of subjects for the plenary lectures, to various aspects of either X-ray fluorescence or dif fraction.

398 pages, 104 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released July 24, 2012
ISBN13 9781461399957
Publishers Springer-Verlag New York Inc.
Pages 398
Dimensions 170 × 244 × 22 mm   ·   666 g
Language English  
Editor Russ, John C.

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