Advances in X-Ray Analysis: Volume 22 - Gregory J Mccarthy - Books - Springer-Verlag New York Inc. - 9781461399896 - December 12, 2012
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Gregory J Mccarthy
Advances in X-Ray Analysis: Volume 22 Softcover reprint of the original 1st ed. 1979 edition

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In keeping with recent practice, this year's Denver Conference on Applications of X-ray Analysis emphasized x-ray diffraction and was co-sponsored by JCPDS, International Center for Diffraction Data.

492 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 12, 2012
ISBN13 9781461399896
Publishers Springer-Verlag New York Inc.
Pages 492
Dimensions 170 × 244 × 26 mm   ·   807 g
Language English  
Editor McCarthy, Gregory J.

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