Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science - Lawrence C Wagner - Books - Springer-Verlag New York Inc. - 9781461372318 - November 9, 2012
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Lawrence C Wagner
Failure Analysis of Integrated Circuits: Tools and Techniques - The Springer International Series in Engineering and Computer Science Softcover reprint of the original 1st ed. 1999 edition

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This "must have" reference work for semiconductor professionals and researchers provides a basic understanding of how the most commonly used tools and techniques in silicon-based semiconductors are applied to understanding the root cause of electrical failures in integrated circuits.

255 pages, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released November 9, 2012
ISBN13 9781461372318
Publishers Springer-Verlag New York Inc.
Pages 255
Dimensions 155 × 235 × 14 mm   ·   385 g
Language English  
Editor Wagner, Lawrence C.

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