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Atom Probe Tomography: Analysis at the Atomic Level Michael K. Miller Softcover reprint of the original 1st ed. 2000 edition
Atom Probe Tomography: Analysis at the Atomic Level
Michael K. Miller
The microanalytical technique of atom probe tomography (APT) permits the spatial coordinates and elemental identities of the individual atoms within a small volume to be determined with near atomic resolution.
254 pages, biography
| Media | Books Paperback Book (Book with soft cover and glued back) |
| Released | October 28, 2012 |
| ISBN13 | 9781461369219 |
| Publishers | Springer-Verlag New York Inc. |
| Pages | 239 |
| Dimensions | 170 × 244 × 14 mm · 426 g |
| Language | English |
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