Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing - Michael Nicolaidis - Books - Springer-Verlag New York Inc. - 9781441969927 - September 30, 2010
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Michael Nicolaidis
Soft Errors in Modern Electronic Systems - Frontiers in Electronic Testing 2011 edition

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Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.

336 pages, biography

Media Books     Hardcover Book   (Book with hard spine and cover)
Released September 30, 2010
ISBN13 9781441969927
Publishers Springer-Verlag New York Inc.
Pages 318
Dimensions 155 × 235 × 19 mm   ·   644 g
Language English  
Editor Nicolaidis, Michael

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