Thermal Testing of Integrated Circuits - J. Altet - Books - Springer-Verlag New York Inc. - 9781441952875 - September 21, 2011
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J. Altet
Thermal Testing of Integrated Circuits Softcover reprint of the original 1st ed. 2002 edition

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Temperature has been always considered as an appreciable magnitude to detect failures in electric systems. In this book, the authors present the feasibility of considering temperature as an observable for testing purposes, with full coverage of the state of the art.

204 pages, 102 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released September 21, 2011
ISBN13 9781441952875
Publishers Springer-Verlag New York Inc.
Pages 204
Dimensions 155 × 235 × 12 mm   ·   322 g
Language English  

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