High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics - Ullrich Pietsch - Books - Springer-Verlag New York Inc. - 9781441923073 - December 12, 2011
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Ullrich Pietsch
High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures - Advanced Texts in Physics 2nd ed. 2004. Softcover reprint of the original 2n edition

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During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials.

408 pages, 389 black & white illustrations, biography

Media Books     Paperback Book   (Book with soft cover and glued back)
Released December 12, 2011
ISBN13 9781441923073
Publishers Springer-Verlag New York Inc.
Pages 408
Dimensions 155 × 235 × 22 mm   ·   594 g
Language English  

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