Scanning Microscopy for Nanotechnology: Techniques and Applications - Weilie Zhou - Books - Springer-Verlag New York Inc. - 9781441922090 - October 29, 2010
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Weilie Zhou
Scanning Microscopy for Nanotechnology: Techniques and Applications Softcover reprint of hardcover 1st ed. 2007 edition

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This book presents scanning electron microscopy (SEM) fundamentals and applications for nanotechnology. It includes integrated fabrication techniques using the SEM, such as e-beam and FIB, and it covers in-situ nanomanipulation of materials. The book will appeal to nanomaterials researchers, and to SEM development specialists.

538 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released October 29, 2010
ISBN13 9781441922090
Publishers Springer-Verlag New York Inc.
Pages 522
Dimensions 155 × 235 × 27 mm   ·   743 g
Language English  
Editor Wang, Zhong Lin
Editor Zhou, Weilie

See all of Weilie Zhou ( e.g. Hardcover Book and Paperback Book )