Reliability Prediction for Microelectronics - Quality and Reliability Engineering Series - Bernstein, Joseph B. (Ariel University, Israel) - Books - John Wiley & Sons Inc - 9781394210930 - February 20, 2024
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Bernstein, Joseph B. (Ariel University, Israel)
Reliability Prediction for Microelectronics - Quality and Reliability Engineering Series 1st edition

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384 pages

Media Books     Hardcover Book   (Book with hard spine and cover)
Released February 20, 2024
ISBN13 9781394210930
Publishers John Wiley & Sons Inc
Pages 400
Dimensions 201 × 235 × 28 mm   ·   703 g
Language English  

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