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Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices Epperlein, Peter W. (Pwe-PhotonicsElectronics-IssueResolution; University of Stuttgart, Germany)
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Semiconductor Laser Engineering, Reliability and Diagnostics: A Practical Approach to High Power and Single Mode Devices
Epperlein, Peter W. (Pwe-PhotonicsElectronics-IssueResolution; University of Stuttgart, Germany)
This reference book provides a fully integrated novel approach to the development of high-power, single-transverse mode, edge-emitting diode lasers by addressing the complementary topics of device engineering, reliability engineering and device diagnostics in the same book, and thus closes the gap in the current book literature.
522 pages, Illustrations
| Media | Books Hardcover Book (Book with hard spine and cover) |
| Released | February 22, 2013 |
| ISBN13 | 9781119990338 |
| Publishers | John Wiley & Sons Inc |
| Pages | 520 |
| Dimensions | 160 × 236 × 38 mm · 771 g |
| Language | English |
