Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics — 2004 - MRS Proceedings - - Books - Cambridge University Press - 9781107409224 - June 5, 2014
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Materials, Technology and Reliability for Advanced Interconnects and Low-K Dielectrics — 2004 - MRS Proceedings

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The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners.

422 pages, black & white illustrations

Media Books     Paperback Book   (Book with soft cover and glued back)
Released June 5, 2014
ISBN13 9781107409224
Publishers Cambridge University Press
Pages 422
Dimensions 152 × 229 × 22 mm   ·   668 g   (Weight (estimated))
Language English  
Editor Carter, R. J.
Editor Hau-Riege, C. S.
Editor Kloster, G. m.
Editor Lu, T. -M. (Rensselaer Polytechnic Institute, New York)
Editor Schulz, S. E.

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